Norhof LN2 Auto-Fill Solutions for Electron and Ion Microscopy (SEM, TEM, FIB, Cryo-EM)
Efficient and reliable cooling is essential in advanced electron and ion microscopy to ensure the highest image quality, stable sample conditions, and long, uninterrupted operating periods. Norhof’s innovative LN2 auto-fill system delivers exactly that—a dependable and maintenance-free liquid nitrogen supply for your SEM, TEM, FIB, and Cryo-EM setups.
Automated Precision and Consistency
Norhof’s LN2 auto-fill system is designed to automatically and continuously refill your microscope Dewars directly from a low-pressure storage vessel. Using our proven microdosing technology, it ensures precise and spill-free LN2 delivery, eliminating the risks of manual refilling such as sample contamination, detector warm-up, and instrument downtime.
Key Benefits
- – Uninterrupted Operation: Keeps your cryogenic stages, holders, or detectors at a stable low temperature, even during long and demanding imaging sessions.
- – Enhanced Safety & Lab Efficiency: Minimizes manual handling of liquid nitrogen, reducing hazards and freeing up valuable researcher time.
- – Superior Sample Quality: Maintains ideal sample conditions for high-resolution imaging and analytical accuracy in cryo-EM, cryo-FIB, and other temperature-sensitive workflows.
- – Universal Compatibility: Norhof’s solutions can integrate with a wide range of electron and ion microscopes from all leading manufacturers.
Applications:
- – Scanning Electron Microscopy (SEM) with cryo-stages or detectors
- – Transmission Electron Microscopy (TEM), including cryo-TEM and tomography
- – Focused Ion Beam (FIB) systems with cryogenic sample preparation
- – Cryo-Electron Microscopy (Cryo-EM) for structural biology and nanoscience
How the Norhof LN2 Auto-Fill Works
The system uses a programmable controller to monitor LN2 levels in the Dewar and dispenses liquid nitrogen only when needed. Our microdosing pumps guarantee precision, safety, and efficiency for any fill volume or microscopy platform.
Custom and OEM Solutions
Norhof offers tailored adapters and integration kits for nearly every microscopy brand, including JEOL, FEI/Thermo Fisher Scientific, Zeiss, Hitachi, Leica, Tescan, and more. If your instrument requires a unique interface, our engineering team develops custom solutions to ensure a perfect fit.
We regularly supply adapters for Electron and Ion Microscopy (SEM, TEM, FIB, Cryo-EM) instruments from well-known suppliers such as:
- – JEOL
- NEOARM, JEM-ARM200F, JEM-120i, JEM-200, JEM-1400, JEM-2100, and more
- – FEI/Thermo Fisher Scientific
- Scios Cryo-FIB, Quattro S Cryo ESEM, Quanta 200 DEM, Dualbeam chamber port G3 or G4 and more
- – Zeiss
- Quorum/Linkam cryo‑systems on Crossbeam 540/550 and more
- – Hitachi
- S‑4700 / S‑4800 / S‑3400 / S‑3700 / S‑4100 / S‑4300 field‑emission SEMs with LN2 cold trap, SU‑70 / SU‑8000 series and other modern Hitachi FE‑SEMs with integrated LN2 trap option and more
- – Delmic
- – Leica
- EM VCT100 and EM VCT500 cryo stage / docking station and more
- – Tescan
- AMBER 2 cryogenic Ga FIB‑SEM, AMBER X2 plasma FIB‑SEM, S8000G FIB/SEM in cryo configuration and more
- – Dewars of Microscopy Solutions and more
If your instrument brand is not listed here, please contact us for a bespoke adapter solution. Thanks to our extensive experience, we can accommodate almost any Dewar configuration.
For more information or personalized advice, please contact our technical team.
Why Choose Norhof?
With decades of experience in LN2 microdosing technology, Norhof enables labs worldwide to maximize uptime and sample quality. Our systems are trusted in demanding research, medical, and industrial environments.
Contact Norhof today to discuss optimizing your electron or ion microscopy workflow with our LN2 auto-fill solutions.